Journal of Chemical Physics, Vol.101, No.4, 2746-2751, 1994
Far-Infrared Reflection-Absorption Spectroscopy of Thin Polyethylene Oxide-Films
We report the temperature dependent far-infrared spectrum of ultra-thin films of polyethylene oxide (PEO). Using the orientational specificity of infrared and far-infrared reflection-absorption spectroscopy and in-situ recrystallization, we find that during spin coating the PEO helices are initially in the plane of the him, but on crystallization reorient to be normal to the substrate. A splitting of the C-O torsional mode near 109 cm(-1) is identified as arising from a distortion of the normal helical structure of PEO. Comparison with transmission spectra of cast films demonstrates the value of far-infrared reflection-absorption spectroscopy (FIRRAS) in the study of crystalline polymers in the far infrared.
Keywords:POLY(ETHYLENE OXIDE)