A novel technique to measure heat transfer and liquid film thickness distributions over relatively large areas for two-phase flow and heat transfer phenomena using infrared (IR) thermometry is described. IR thermometry is an established technology that can be used to measure temperatures when optical access to the surface is available in the wavelengths of interest. In this work, a midwave IR camera (3.6-5.1 mu m) is used to determine the temperature distribution within a multilayer consisting of a silicon substrate coated with a thin insulator. Since silicon is largely transparent to IR radiation, the temperature of the inner and outer walls of the multilayer can be measured by coating selected areas with a thin. IR opaque film. If the fluid used is also partially transparent to IR, the flow can be visualized and the liquid film thickness can be measured. The theoretical basis for the technique is given along with a description of the test apparatus and data reduction procedure. The technique is demonstrated by determining the heat transfer coefficient distributions produced by droplet evaporation and flow boiling heat transfer. (C) 2011 Elsevier Ltd. All rights reserved.