Previous Article Next Article Table of Contents Journal of Crystal Growth, Vol.388, 150-150, 2014 DOI10.1016/j.jcrysgro.2013.11.070 Export Citation Cross-sectional X-ray microdiffraction study of a thick AlN film grown on a trench-patterned AlN/alpha-Al2O3 template (vol 381, pg 37, 2013) Khan DT, Takeuchi S, Kikkawa J, Nakamura Y, Miyake H, Hiramatsu K, Imai Y, Kimura S, Sakata O, Sakai A Please enable JavaScript to view the comments powered by Disqus.
