Application of microwave detection to studies of electron transport properties in novel crystalline materials is presented. Using conventional electron paramagnetic resonance spectrometer, we investigate edge magnetoplasma resonance and Shubnikov-de Haas oscillations in GaN/AlxGa1-xN heterostructures, quantum interference phenomena (weak localization and antilocalization) in GaN/AlxGa1-xN heterostructures, epitaxial graphene and Bi2Te2Se topological insulator, and the cyclotron resonance in Bi2Te3 topological insulator. The detection technique and conditions that must be met by samples, as well as advantages of the method of characterization are discussed. (C) 2013 Elsevier B.V. All rights reserved.