Ferroelectric Bi3.25La0.75Ti3O12 thin films were prepared using bismuth acetate, lanthanum acetate and titanium (diisopropoxide)bis(acetylacetonate) as precursors by chemical solution deposition. The BLT thin films were annealed as a function of annealing temperature in a furnace. The structure and the surface morphology of the thin films were characterized by x-ray diffraction and fileld emission scanning electron microscopy. The electrical measurements were performed using a RT66A. The grain size of the thin films increased with increasing furnace annealing temperature. The remanent polarization(2Pr) and the coercive fileld(Ec) of the thin film annealed at 650 ℃ were 10 μC/cm(2) and 68.75 kV/cm. The thin film annealed at 700 ℃ were 17 μC/cm(2) 75 kV/cm.