A new approach employing two pollution rose plots to locate the sources of multiple hazardous gas emissions was proposed and tested in an industrial area. The data used for constructing the pollution rose plots were obtained from two side-by-side measurements of open-path Fourier Transform Infrared (OP-FTIR) spectrometers during one week of continuous analysis on the rooftop of a semiconductor plant. Hazardous gases such as CF4, C2F6, CH3OH, NH3, NO2, and SF6 were found and quantified at the ppb level by both OP-FTIR measurement sites. The data of the top 20% highest concentrations and associated wind directions were used to construct the pollution rose plots. Pollution source probability contours for each compound were constructed using the probability-product of directional probability from two pollution rose plots. Hot spots for SF6, CF4, NO2, and C2F6 pointed to the stack area of the plant, but the sources of CH3OH and NH3 were found outside of this plant. The influences of parameters for this approach such as the variation in wind direction, lower limit concentration threshold and the nearby buildings were discussed. (C) 2013 Elsevier B.V. All rights reserved.