The simultaneous measurement of Fourier transform infrared (FTIR) transmission spectra and 2-dimensional wide-angle X-ray diffraction (WAXD) and small-angle X-ray scattering (SAXS) patterns has been performed successfully to investigate the hierarchical structure changes occurring in the stress-induced phase transition phenomenon of uniaxially oriented poly(tetramethylene terephthalate) film. The molar fraction of the beta-crystal form, evaluated from the IR and WAXD data analyses, increased steeply in the plateru region of the stress-strain curve as already known well. The 2D SAXS data have revealed the remarkable and reversible change in the stacked lamellar structure just after the alpha-to-beta phase transition was completed, where the tilting angle of the stacked lamellae measured from the draw axis of the oriented sample became zero, and the lamellar thickness increased due the inclusion of amorphous region located in the boundary part of the crystalline lamellae. In parallel, the X-ray reflection spots in a wider diffraction angle region became diffuse in the observed WAXD pattern of the beta form, indicating the packing disorder of the mechanically stressed chains. In this way, the simultaneous combination of the 3 different types of equipments has allowed us to deduce the detailed structural change from the various levels: the stress-induced alpha-beta transition was found to occur not only with the remarkable changes in the molecular chain conformation and chain packing mode in the crystal lattice, but also with the large and reversible change in the lamellar stacking structure. The stress-induced changes in lamellar thickness and long period were simulated using a mechanical model with these hierarchical structure changes taken into account, giving relatively good reproduction of the observed data.