Materials Science Forum, Vol.363-3, 490-492, 2001
The estimation of the vacancy-type defects density in thin Fe film with slow positron beams
The positron annihilation parameters vs. the incident positron energy are measured in the thin Fe (50 nm) film and the Fe (50 nm)/Hf (50 nm) bilayers on quartz glass substrate, by means of the variable energetic slow-positron beam method. We have analyzed the change in vacancy-type defects in these thin films with the deposition temperature in the MBE system.