Fe-Zr films with Zr content of 13 at.% were epitaxially grown on MgO(001) substrates by a sputtering method and their magnetic and structural properties were examined hv XRD, VSM and torque magnetometer in order to investigate some basic properties of Fe-Zr films An excellent epitaxial growth could be confirmed by (110) pole figures and by other method of XRD. Grazing angle method in XRD showed an orthorhombic deformation of the epitaxial films. No phase other than alpha -Fe was observed in all films. The M-s, K-1 value and lattice parameters of the Fe-6.4 at.% Zr films were away from the linear variation with Zr content, which was probably due to the segregation of Zr atoms.