In the past it was pointed already to a possible innovation in angle resolved X-ray diffraction by using energy resolving detectors [1]. The advantages are striking: no need of neither primary nor secondary monochromator, easy separation of the device function without any mathematical modelling by using a set of standard energy spectra, possible usage or discrimination of all spectral lines without any intensity loss of the main line, complete discrimination of any kind of background caused by differing spectral components and shortening of measuring time. The result is a diffraction profile solely caused by the specimen. We can show now that it is possible to separate not only K alpha- and K beta- but also K alpha (1)- and K alpha (2)-diffraction patterns although the detector-beside not yet applicable ones-by itself never would resolve those latter lines. Therefore one must not fear the superposition of different hkl diffraction lines caused by different spectral lines. Prerequisite is a detection system with a detector response free of any intensity dependence and an extremely stable amplification which provides constant peak positions for each energy. The examples presented were measured with an electroluminescence detector [2].