Materials Science Forum, Vol.378-3, 218-223, 2001
Comparison of optical elements for X-ray diffraction analysis in para-focusing and parallel beam geometries
The classical Bragg-Brentano para-focusing geometry is widely used for analyzing flat polycrystalline samples. In the last decades parallel beam geometries have clearly gained importance. Criteria for selecting the best geometrical arrangement as well as the best possible configuration are discussed and illustrated with measurements.