Materials Science Forum, Vol.389-3, 725-728, 2002
In situ RHEED analysis of the Ge-induced surface reconstructions on 6H-SiC(0001)
The structural evolution of differently prepared silicon carbide surfaces during germanium deposition was investigated by real time in Situ reflection high energy electron diffraction. The phase diagrams of germanium related surface reconstructions on different reconstructed silicon carbide Surfaces were determined.