화학공학소재연구정보센터
Materials Science Forum, Vol.389-3, 1285-1288, 2002
Electrical characterization of high-voltage 4H-SiC diodes on high-temperature CVD-grown epitaxial layers
High-temperature chemical vapour deposition (HTCVD) in a vertical chimney reactor was used to grow thick low-doped epitaxial layers of 4H silicon carbide. These layers were used as drift layers in a combined process to manufacture both bipolar and unipolar high-voltage diodes. The resulting diodes were characterized electrically in order to gain knowledge about the electric quality of the HTCVD epitaxial layers to assess the high-voltage properties of this material.