Two-dimensional x-ray diffraction (XRD2) refers to x-ray diffraction applications with two-dimensional (2D) detector and corresponding data reduction and analysis. The two-dimensional diffraction pattern contains far more information than a one-dimensional profile collected with the conventional diffractometer. In order to take the advantages of the :2D detector, new approaches are necessary to configure the two-dimensional x-ray diffraction system and to analyze the 21) diffraction data. The present paper is an introduction to some fundamentals about stress and texture analysis with two-dimensional x-ray diffraction using the Bruker GADDS system as an example.