화학공학소재연구정보센터
Materials Science Forum, Vol.414-4, 411-418, 2003
Nanostructure analysis of complex materials using two-dimensional small angle x-ray scattering
Small-angle x-ray scattering is an ideal tool for studying structures in the size range typically between 1 and 100 nanometers. This includes microstructures in materials, microporosity, microemulsions, the long periods of polymers and many other questions. More complex and in particular anisotropic: systems, like single crystals, fibrous or layered structures require the use of a point focus for the x-ray beam and the capability of two-dimensional detection of the small angle scattering signal. The first section gives a brief theoretical background of small-angle scattering and the second describes the experimental equipment (NanoStar). The remaining sections review a series of examples for the use of the NanoStar system.