Materials Science Forum, Vol.443-4, 99-102, 2004
Computer simulation for X-ray analysis of nanostructured Cu processed by severe plastic deformation
A computer simulation-based approach has been developed in order to reveal gain boundary defect structure of nanomaterials, which is described in terms of extrinsic grain boundary dislocations. On the basis of comparative analysis of numerically obtained results to experimental data, the defect structure parameters of nanostructured materials produced by severe plastic deformation have been evaluated.
Keywords:defect structure;grain boundary dislocations;nanostructured materials;severe plastic deformation;X-ray analysis