A silicon steel single crystal with {110}<001> Goss orientation was cold rolled up to 89 % thickness reduction and subsequently annealed. The evolution of the macroscopic cold rolling texture was investigated by x-ray diffraction. Local orientation relationships and the microstructure around and within Goss grains of deformed and annealed samples were analysed using the electron backscatter diffraction (EBSD) technique. During cold rolling a texture consisting of two strong {111}<112> components and a minor {110}<001> Goss component develops. After primary recrystallisation the texture is characterized by a strong Goss component. Goss-oriented grains that remain after high deformation are considered to be the origin for the primary recrystallisation texture.