Previous Article Next Article Table of Contents Materials Science Forum, Vol.490-491, 684-689, 2005 Export Citation XRD stress analysis in a-TiAl based intermetallic multicrystal Seiler W, Hoel G, Thomas M, Ji V Keywords:intermetallic;residual stress;XRD;single crystal;TiAl Please enable JavaScript to view the comments powered by Disqus.
