In this study, crystals of CdTe were grown from melts, which have undergone different thermal history, by the unseeded gradient freeze method using the Universal Multizone Crystallizator (UMC). The effects of melt conditions on the quality of grown crystal were studied by various characterization techniques, including Synchrotron White Beam X-ray Topography (SWBXT), atomic force microscopy (AFM), electrical conductivity and Hall measurements.