In the present study, platinum-iridium alloys (Ir = 15.8, 27.3, 36.1, 100at.%) were electroplated on a nickel-base single crystal superalloy TMS-82+ followed by a diffusion treatment at 1373K for 1 h. Interdiffusion behavior between the Pt-Ir films and substrates was investigated in terms of chemical composition, phase constitution and morphology. X-ray analysis revealed that annealed specimens consisted of several fcc solid solutioned phases with various lattice parameters, together with ordered intermetallic compounds (Ll(2)-(Pt,Ni)(3)Al and B2-(IrNi)Al), due to the inward diffusion of Pt and Ir from the electrodeposited films to the superalloy substrates, and the outward diffusion of solute elements (Ni, Al, Cr, Co) in the superalloy substrates into the films during annealing. The depth concentration analysis indicated that the Pt-36.1 Ir film effectively retarded the outward diffusion of solute elements, especially nickel, from the substrate.