The spherulite formation in poly(vinyliden fluoride) (PVDF)/poly(methyl methacrylate) (PMMA) blend was investigated by time-resolved light scattering under H_v(cross-polarized) optical alignment using (CCD) camera system. The final morphology was observed by atomic force microscopy (AFM) images and optical microscope (OM). The coarse spherulite was observed at high temperature (162℃) by OM, whereas the compact spherulite was appeared at low temperature (148℃ ). In the compact spherulite, the spherulite radius linearly increased with time. The order parameter defined by the sharpness of H_v scattering profile monotonously decreased with crystallization. In the coarse spherulite, the spherulite linearly grew, stopped growth for a while, and then restarted i.e., a pause in growth was observed. It was ascribed to the rejection of the noncrystallizable component (PMMA) at spherulite growth front. The order parameter initially increased, attained a maximum, and then decreased. Time at maximum point was consistent with onset time of a pause in the spherulite growth. Thus, a maximum in order parameter may be ascribed to the rejected PMMA at the spherulite growth front. A supplemental evidence for these results was provided by the morphology observation of the AFM