Solid-State Electronics, Vol.86, 17-21, 2013
Electrical characterization of Schottky contacts to N-polar GaN
The Schottky barrier heights of several metals (Cu, Au, Pd, Ni, and Pt) to N-polar GaN were extracted using current-voltage and capacitance-voltage measurements. The dependence of barrier height on metal was found to vary linearly with the electronegativity of the metal as predicted by the metal-induced gap states (MIGS)-and-electronegativity model. However, the magnitude of the barrier heights are lower than those predicted by the MIGS model for GaN and lower than the experimentally measured barrier heights for Ga-polar GaN. It is likely that the polarization-induced charge at the N-polar GaN surface is responsible for the reduced barrier height. (C) 2013 Elsevier Ltd. All rights reserved.