The distribution of magnesium ions at the lanthanum and silicon sites in MgO-doped lanthanum silicate oxyapatite as well as the concentration of neutral lanthanum vacancies were determined using densities and chemical compositions of the doped samples. On the basis of the density data, it was found that magnesium ions are substituted at the silicon site as well as the lanthanum sites in the oxyapatite phase. Owing to the existence of neutral lanthanum vacancies, it was difficult to evaluate the number of the oxygen ions present, Which are related to the oxygen ion conductivity of the compound, from the chemical compositions of the samples alone. Further, it was found that the fact that the total conductivity of MgO-doped lanthanum silicate oxyapatite depends on the MgO concentration as well as that of other defects could not be explained on the basis of conventional defect chemistry. (c) 2014 Elsevier B.V. All rights reserved.