CdSexTe1-x thin films were brush plated on titanium and conducting glass substrates from the precursors at different substrate temperatures in the range of 30-80 degrees C. X-ray diffraction studies indicated the films to possess hexagonal structure irrespective of composition. The strain and dislocation density decrease with increase of substrate temperature. The crystallite size increased from 30 to 100 nm as the substrate temperature increased. The resistivity of the films decreased with increase of substrate temperature. The carrier density and mobility increased with substrate temperature. Optical band gap of the films varied in the range of 1.45-1.72 eV. Higher photosensitivity was obtained compared to earlier reports. (C) 2009 Elsevier Ltd. All rights reserved.