Ag2Cu2O3 thin films were deposited on glass substrates by radio frequency magnetron sputtering of an equiatomic silver-copper target (Ag0.5Cu0.5) in reactive Ar-O-2 mixtures. Characterization of these films by temperature dependent spectrophotometry (UV-vis-NIR) and photoluminescence shows several inter-band transitions (most prominently around 2.2 eV), band gap narrowing with increasing temperature and negative thermal quenching of the luminescence intensity. Characterization by temperature dependent Hall effect measurements reveals two dopant levels with ionization energies of around 3 and 16 meV, and net concentrations of around 1x10(15) and 4x10(21) cm(-3), respectively. (C) 2013 Elsevier B.V. All rights reserved.