Thin Solid Films, Vol.550, 319-325, 2014
Characterization of poly- and single-crystal uranium-molybdenum alloy thin films
Poly- and single-crystal thin films of U-Mo alloys have been grown both on glass and sapphire substrates by ultra-high vacuum magnetron sputtering. X-ray and Electron Backscatter Diffraction data indicate that for single-crystal U1-xMox alloys, the pure cubic uranium gamma-phase exists for x >= 0.22 (10 wt.% Mo). Below 10 wt.% Mo concentration, the resulting thin film alloys exhibited a mixed alpha-gamma uranium phase composition. (C) 2013 Published by Elsevier B.V.
Keywords:Magnetron sputtering;Uranium-molybdenum alloy;Polycrystalline thin films;Single-crystal thin film microstructure;X-ray diffraction;Focus ion beam;Scanning electron microscopy