Korean Journal of Materials Research, Vol.18, No.7, 373-378, July, 2008
전자빔증발법에 의한 Ba(Ti,Sn)O3막의 제조 및 특성
Synthesis and Properties of Ba(Ti,Sn)O3 Films by E-Beam Evaporation
E-mail:
Ba(Ti,Sn)O3 thin films, for use as dielectrics for MLCCs, were grown from Sn doped BaTiO3 sources by e-beam evaporation. The crystalline phase, microstructure, dielectric and electrical properties of films were investigated as a function of the (Ti+Sn)/Ba ratio. When BaTiO3 sources doped with 20~50 mol% of Sn were evaporated, BaSnO3films were grown due to the higher vapor pressure of Ba and Sn than of Ti. However, it was possible to grow the Ba(Ti,Sn)O3 thin films with ≤15 mol% of Sn by co-evaporation of BTS and Ti metal sources. The (Ti+Sn)/Ba and Sn/Ti ratio affected the microstructure and surface roughness of films and the dielectric constant increased with increasing Sn content. The dielectric constant and dissipation factor of Ba(Ti,Sn)O3 thin films with ≤15 mol% of Sn showed the range of 120 to 160 and 2.5~5.5% at 1 KHz, respectively. The leakage current density of films was order of the 10.9~10.8 A/cm2 at 300 KV/cm. The research results showed that it was feasible to grow the Ba(Ti,Sn)O3 thin films as dielectrics for MLCCs by an e-beam evaporation technique.
- Kishi H, Mizuno Y, Chazono H, Jpn. J. Appl. Phys., 42(1), 1 (2003)
- Randall M, in proceedings of the CARTS USA 2000 symposium (Huntington Beach, CA, March, 2000), 195 (2000). (2000)
- Sakabe Y, Takeshima Y, Tanaka K, J. Electroceram., 3, 115 (1999)
- Mustofa S, Araki T, Furusawa T, Nishida M, Hino T, Mater. Sci. Eng. B, 103, 128 (2003)
- Sakabe Y, Ceramics, (in Japan), 36, 407 (2001)
- Joshi PC, Desu SB, Thin Solid Films, 300(1-2), 289 (1997)
- Markovic S, Mitric M, Cvjeticanin N, Uskokovic D, J. Eur. Ceram. Soc., 27, 505 (2007)
- Steinhausen R, Kouvatov A, Beige H, Langhammer HT, Abicht HP, J. Eur. Ceram. Soc., 24, 1677 (2004)
- Mueller V, Jager L, Beige H, Abicht HP, Muller T, Solid State Commun., 129, 757 (2004)
- Zarate RA, Kabrera AL, Volkman UG, Fuenzalida V, J. Phys. Chem. Solids, 59, 1639 (1998)
- Feuersanger AE, Hagenlocher AK, Solomon AL, J. Electrochem. Soc., 111, 1387 (1964)
- Park SS, Ha JH, Wadley HN, Integrated Ferroelectrics, 99, 105 (2008)
- Ding SW, Chai J, Feng CY, Mater. Lett., 60, 3241 (2006)
- Bak W, Kajtoch C, Starzyk F, Mater. Sci. Eng. B, 100, 9 (2003)
- Kajtoch C, Mater. Sci. Eng. B, 64, 25 (2003)
- Kumar A, Singh BP, Choudhary RNP, Thakur AK, Mater. Lett., 59, 1880 (2005)
- Dietz GW, Schumacher M, Waser R, Streiffer SK, Basceri C, Kingon AI, J. Appl. Phys., 82, 2359 (1997)
- Wei Z, Noda M, Okuyama M, Jpn. J. Appl. Phys., 41, 6619 (2002)
- Shu N, Kumar A, Alam MR, Chan HL, You Q, Appl. Surf. Sci., 109, 366 (1997)