화학공학소재연구정보센터
Korean Journal of Materials Research, Vol.18, No.1, 38-44, January, 2008
Sn-4.0wt%Ag-0.5wt%Cu 솔더 접합계면의 강도특성과 미세파괴거동에 대한 In-situ관찰
In-situ Observation on Micro-Fractural Behavior and Strength Characteristics in Sn-4.0wt%Ag-0.5wt%Cu Solder Joint Interface
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The micro-structural changes, strength characteristics, and micro-fractural behaviors at the joint interface between a Sn-4.0wt%Ag-0.5wt%Cu solder ball and UBM treated by isothermal aging are reported. From the reflow process for the joint interface, a small amount of intermetallic compound was formed. With an increase in the isothermal aging time, the type and amount of the intermetallic compound changed. The interface without an isothermal treatment showed a ductile fracture. However, with an increase in the aging time, a brittle fracture occurred on the interface due mainly to the increase in the size of the intermetallic compounds and voids. As a result, a drastic degradation in the shear strength was observed. From a microshear test by a scanning electron microscope, the generation of micro-cracks was initiated from the voids at the joint interface. They propagated along the same interface, resulting in coalescence with neighboring cracks into larger cracks. With an increase in the aging time, the generation of the micro-structural cracks was enhanced and the degree of propagation also accelerated.
  1. Wei YY, Duh JG, J. Mater. Sci. Mater. El., 9(5), 373 (1998)
  2. Choi S, Bieler TR, Lucas JP, Subramanian KN, J. Electron. Mater., 28(11), 1209 (1999)
  3. Oettel H, Wiedemann R, Surf. Coat. Technol., 76(1), 265 (1995)
  4. Ravichandran KS, Mat. Sci. Eng. A, 201(1-2), 269 (1995)
  5. Frear DR, Vianco PT, Metall. Mater. Trans. A, 25(7), 1509 (1994)
  6. Prakash KH, Sritharan T, Acta Mater., 49(13), 2481 (2001)
  7. Ghosh G, Pfeifer MJ, J. Electron. Mater., 30(9), 1145 (2001)
  8. Yoon JW, Lee CB, Jung SB, Mater. Sci. Technol., 19(8), 1101 (2003)
  9. Flanders DR, Jacobs EG, Pinizzotto RF, J. Electron. Mater., 26(7), 883 (1997)
  10. McCormack M, Jin S, Kammlott GW, Chen HS, Appl. Phys. Lett., 63(1), 15 (1993)
  11. Yang W, Messler RW, J. Electron. Mater., 23(8), 765 (1994)
  12. Chiou BS, Liu KC, Duh JG, Palanisamy PS, IEEE. Trans. CHMT, 13(2), 207 (1990)
  13. Wang Y, Tu KN, Appl. Phys. Lett., 67(8), 1069 (1995)
  14. Lee SH, Park BW, J. H. J, Kwon D, in Proceeding of the Tenth Conference on Mechanical Behaviors of Materals (Ansan, Korea, October 1996) P.521. (1996)
  15. Chen CJ, Lin KL, J. Electron. Mater., 29(8), 1007 (2000)