고순도 나이오븀과 탄탈륨 희유금속의 물리적 특성평가

김일호; 박종범; 유신욱; 조경원; 최국선; 서창열; 김병규; 김준수; Il-Ho Kim; Jong-Bum Park; Sin-Wook You; Kyung-Won Cho; Good-Sun Choi; Chang-Youl Suh; Byoung-Gyu Kim; Joon-Soo Kim

Korean Journal of Materials Research, Vol.15, No.4, 217-223, April, 2005

DOI10.3740/MRSK.2005.15.4.217 Export Citation

고순도 나이오븀과 탄탈륨 희유금속의 물리적 특성평가

Physical Property Evaluation for High Purity Niobium and Tantalum Rare Metals

김일호 ^†, 박종범, 유신욱, 조경원, 최국선¹, 서창열¹, 김병규¹, 김준수¹

충주대학교 신소재공학과/친환경 에너지 변환 저장소재 및 부품개발 연구센터
¹한국지질자원연구원 자원활용소재연구부

Il-Ho Kim^†, Jong-Bum Park, Sin-Wook You, Kyung-Won Cho, Good-Sun Choi¹, Chang-Youl Suh¹, Byoung-Gyu Kim¹, and Joon-Soo Kim¹

Department of Materials Science and Engineering/ReSEM, Chungju National University, Korea
¹Minerals and Materials Processing Division, Korea Institute of Geoscience, Mining and Materials, Korea

E-mail:

Thermal, electrical and mechanical properties of high purity niobium and tantalum refractory rare metals were investigated tn evaluate the physical purity. Higher purity niobium and tantalum metals showed lower hardness due to smaller solution hardening effect. Temperature dependence of electrical resistivity showed a typical metallic behavior. Remarkable decrease in electrical resistivity was observed for a high purity specimen at low temperature. However, thermal conductivity increased for a high purity specimen, and abrupt increase in thermal conductivity was observed at very low temperature, indicating typical temperature dependence of thermal conductivity for high purity metals. It can be known that reduction of electron-phonon scattering leads to increase in thermal conductivity of high purity niobium and tantalum metals at low temperature.

Keywords:high purity;rare metal;niobium;tantalum

[References]

Eiji H, Yoshidake U, Kinzoku, 72(8), 764 (2002)
Satoshi F, Isamu N, Chouju N, Electronic Materials, 31(1), 45 (1992)
Hashimoto E, Ueda Y, Purification process and characterization of ultra high purity metal, p.249, Springer-Verlag, Tokyo (2001) (2001)
Lovell M, Avery A, Vernon M, Physical properties of materials, ch.7, Van Nostrand Reinhold Co. Ltd., New York (1976) (1976)
Kittel C, Introduction to solid state physics, ch.6, John Wiley & Sons, New York (1986) (1986)
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Mimura K, Ishikawa Y, Isshiki M, Kato M, Mater. Trans. JIM, 38(8), 714 (1997)
Ersoy A, Buyuksagic S, Atici U, Wear, 258(9), 1422 (2005)
Tonshoff HK, Hillman-Apmann H, Asche J, Diam. Relat. Mater., 11(3-6), 736 (2002)
Oishi M, Cobalt News, 11 (1997)
Cobalite, Union Miniere (technical brochure) (2000) (2000)
Next, Eurotungstene Metal Powders (technical brochure) (1997) (1997)
Kwon YJ, Kim TW, Kim YS, J. Kor. Powder Metallurgy Inst., 11(6), 451 (2004)
Quinn TFJ, Wear, 18(5), 413 (1971)
Quinn TFJ, Tribol. Int., 16(5), 257 (1983)
So H, Wear, 184(2), 161 (1995)
So HS, Yu DS, Chung CY, Wear, 253(9-10), 1004 (2002)

[Related Articles]

[1] Eiji H, Yoshidake U, Kinzoku, 72(8), 764 (2002)

[2] Satoshi F, Isamu N, Chouju N, Electronic Materials, 31(1), 45 (1992)

[3] Hashimoto E, Ueda Y, Purification process and characterization of ultra high purity metal, p.249, Springer-Verlag, Tokyo (2001) (2001)

[4] Lovell M, Avery A, Vernon M, Physical properties of materials, ch.7, Van Nostrand Reinhold Co. Ltd., New York (1976) (1976)

[5] Kittel C, Introduction to solid state physics, ch.6, John Wiley & Sons, New York (1986) (1986)

[6] Desal PD, Chu TK, James HM, Ho CY, J. Phys. Chem. Ref. Data, 13(4), 1069 (1984)

[7] Mimura K, Ishikawa Y, Isshiki M, Kato M, Mater. Trans. JIM, 38(8), 714 (1997)

[8] Ersoy A, Buyuksagic S, Atici U, Wear, 258(9), 1422 (2005)

[9] Tonshoff HK, Hillman-Apmann H, Asche J, Diam. Relat. Mater., 11(3-6), 736 (2002)

[10] Oishi M, Cobalt News, 11 (1997)

[11] Cobalite, Union Miniere (technical brochure) (2000) (2000)

[12] Next, Eurotungstene Metal Powders (technical brochure) (1997) (1997)

[13] Kwon YJ, Kim TW, Kim YS, J. Kor. Powder Metallurgy Inst., 11(6), 451 (2004)

[14] Quinn TFJ, Wear, 18(5), 413 (1971)

[15] Quinn TFJ, Tribol. Int., 16(5), 257 (1983)

[16] So H, Wear, 184(2), 161 (1995)

[17] So HS, Yu DS, Chung CY, Wear, 253(9-10), 1004 (2002)