화학공학소재연구정보센터
Korean Journal of Materials Research, Vol.13, No.7, 447-452, July, 2003
Co/IrMn 이층막의 자기적 특성과 Co 두께 및 어닐링의 영향
Effects of Thickness of Ferromagnetic Co Layer and Annealing on the Magnetic Properties of Co/IrMn Bilayers.
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Effects of annealing and thickness of Co layer in Co/IrMn bilayers on the magnetic properties have been investigated. The highest interfacial exchange coupling energy( = 0.12 erg/) was obtained for 10 nm Co layer thickness. Exchange bias field is inversely proportional to the magnetization, the thickness of the pinned layer, and the grain size of antiferromagnetic layer. Also it is related to the interfacial exchange energy difference, which is expected to depend on the surface roughness. These results almost agree with the random-field model of exchange anisotropy proposed by Malozemoff. Exchange bias field decreased slowly with increasing annealing temperature up to X. However, exchange bias field increased above .
  1. Malozemoff AP, Phys. Rev. B, 35, 3679 (1987)
  2. Malozemoff AP, J. Appl. Phys., 63(8), 3874 (1988)
  3. Baibich MN, Broto JM, Fert A, Nguyen Van Dau F, Petroff F, Etienne P, Creuzet G, Friederich A, Chazelas J, Phys. Rev. Lett., 61(21), 2472 (1988)
  4. Anderson G, Huai Y, Miloslawsky L, J. Appl. Phys., 87(9), 6989 (2000)
  5. Kools JCS, IEEE Trans. Magn., 32(4), 3165 (1996)
  6. Xu M, Lu Z, Yang T, Liu C, Cui S, Mai Z, Lai W, Jia Q, Zheng W, J. Appl. Phys., 92(4), 2052 (2002)
  7. Lin T, Mauri D, Staud N, Hwang C, Gorman GL, Appl. Phys. Lett., 65(9), 1183 (1994)
  8. Fuke HN, Saito K, Kamiguchi Y, Iwasaki H, Sahashi M, J. Appl. Phys., 81(8), 4004 (1997)
  9. Van Driel J, Coehoom R, Lenssen KMH, Kuiper AET, De Boer FR, J. Appl. Phys., 85(8), 5522 (1999)
  10. Schulthess TC, Butler WH, J. Appl. Phys., 85(8), 5510 (1999)
  11. Goldman A, Hanbook of Madern Ferromagnetic Materials, p.57, Kluwer Academic publishers, Boston, USA (1999) (1999)
  12. Brandes EA, Brook GB, Smithells Metals Reference Book, 7th ed., p.6-6, Butterworth-Heinemann Ltd., London, England, (1992) (1992)
  13. Lai CH, Anthony TC, Iwamura E, White RL, IEEE Trans. Magn., 32, 3419 (1996)
  14. Anderson GW, Pakala M, Huai Y, IEEE Trans. Magn., 36(5), 2605 (2000)
  15. Iwasaki H, Saito AT, Tsutai A, Sahashi M, IEEE Trans. Magn., 33(5), 2875 (1997)
  16. Maesaka A, Sugawara N, Okabe A, Itabashi M, J. Appl. Phys., 83(12), 7628 (1998)
  17. Takiguchi M, Ishii S, Makino E, Okabe A, J. Appl. Phys, 87(12), 2469 (2000)
  18. Maesaka A, Ishii S, Okabe A, J. Appl. Phys., 88(12), 3982 (2000)
  19. Lee CG, Kim BS, Fukamichi K, IEEE Trans. Magn., 33(5), 2928 (1997)
  20. Arkhipora NK, Klotsman SM, Polikarpova IP, Timofeev AN, Shepatkovskii P, Fiz. Met. metalloved., 62, 1882 (1986)
  21. Iijima Y, Taguchi O, Hirano K, Met. Trans., 8A, 991 (1977)
  22. Han DH, Zhu JG, Judy JH, J. Appl. Phys., 81(8), 4996 (1997)