The global analysis and convolution potential sweep voltammetry (CPSV) procedures for the analysis of electrode kinetic parameters are compared under the influence of residual uncompensated resistance and incomplete charging current correction. An initial examination of simulated data containing these known artifacts indicates that both procedures are similarly susceptible to the effects of uncompensated resistance. CPSV may be unaffected by the effects of incomplete charging current correction, whereas the global analysis procedure does experience some inaccuracies and a combination of both procedures is recommended in this circumstance. The effect of unequal diffusion coefficients is also examined.