화학공학소재연구정보센터
Korean Journal of Materials Research, Vol.12, No.5, 347-352, May, 2002
투명 유전체 (PbO-B 2 O 3 -SiO 2 -Al 2 O 3 계)와 Ag 전극과의 반응에 의한 Ag + 과 Sn 2+ 의 거동
Behavior of Ag + and Sn 2+ After Reaction Between the Transparent Dielectric PbO-B 2 O 3 -SiO 2 -Al 2 O 3 and Ag Electrodes
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A transparent dielectric of the PbO?B 2 O 3 ?SiO 2 ?A1 2 O 3 system which was a low melting glass has been used for PDP (Plasma Display Panel), but it has a problem which is a reaction to be occurred between a transparent dielectric layer and electrodes (Ag, ITO) after firing. This research was conducted for ion migration of Ag + $and Sn^ {2+}duringfiringthreedifferentfritsoflowmeltingglass.Theresultshowedthatyellowingphenomenaoccurredthroughachemicalreactionbetween Ag^+\and Sn^ {2+}at550 58 0^{\circ}Cfor20 60min.Inaddition,itwasconfirmedthatthemigrationof Sn^{2+}$ from ITO electrode made a strong effect on the yellowing phenomena.
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