Novel Lu2WO6:Eu3+ films with excellent luminescence performance were successfully prepared by Pechini method for the first time and characterized with X-ray diffraction (XRD), micro X-ray fluorescence imaging (mu-XRF), atomic force microscope (AFM), and X-ray excited luminescence (XEL), etc. Eu3+-doped films emitted strong red light peak wavelength at 612 nm under both UV light or X-ray excitation. The optimal annealing temperature and Eu3+-doped concentration are around 950 degrees C and 10 mol%, respectively. In addition, luminescence mechanism associated with Eu3+ site occupation and possible energy transfer of Lu2WO6:Eu3+ films have also been proposed. The optimized thin film shows great potential for applications as a candidate for X-ray imaging due to its high density, suitable emission wavelength and high light yield. (C) 2014 Elsevier B.V. All rights reserved.