Solar Energy Materials and Solar Cells, Vol.134, 395-399, 2015
Nanostructured silicon p-layer obtained by radio frequency power profiling process for high-efficiency amorphous silicon solar cell
A RF power profiling process has been developed to efficiently grow nanostructured silicon (nc-Si:H) players for high-efficiency amorphous silicon solar cells. The p-layer deposition starts at a relatively low power in the initial stage, which is then continuously and rapidly increased to a high level until the bulk p-layer deposition is finished. Incorporating the p-layer into a-Si:H solar cell resulted in high V-oc and high FF simultaneously, which can be ascribed to the reduced recombination at the i/p interface caused by the suitable band-gap of p-layer, low ion damage to i/p interface, and appropriate band-gap matching between p- and i-layers during the RF power profiling process. An initial efficiency of 10.8% for an a-Si:H solar cell with both high V-oc of 0.99 V and high FF of 0.72 was obtained. This power profiling scheme is potentially advantageous since it is easier to integrate into continuous process. (C) 2014 Elsevier B.V. All rights reserved.
Keywords:RF power profiling;Nanostructured silicon p-layer;Quantum confinement effect;Amorphous silicon solar cell