Applied Surface Science, Vol.353, 489-493, 2015
Magnetization reorientation induced by interfacial structures in ultrathin disordered FePt film sandwiched by SiO2 layers
In general, ultrathin disordered FePt film exhibits in-plane magnetic anisotropy due to large demagnetization fields and negligible volume anisotropy. Here, we demonstrated that magnetization reorientation from in-plane to out-of-plane takes place when ultrathin disordered FePt film is sandwiched by amorphous SiO2 layers and annealed at 350 degrees C. Based on the interfacial and structural analysis from X-ray photoelectron spectroscopy and high resolution transmission electron microscopy, the reorientation originates from the electronic structural changes because of strong bonding between Fe and O atoms at the top FePt/SiO2 interface. This interface anisotropy plays a crucial role in the magnetic behaviour, resulting in magnetization reorientation of ultrathin disordered FePt film. (C) 2015 Elsevier B.V. All rights reserved.
Keywords:Magnetization reorientation;Interfacial electronic structures;X-ray photoelectron spectroscopy