화학공학소재연구정보센터
Applied Surface Science, Vol.354, 256-259, 2015
Topotactic changes on eta-Mo4O11 caused by biased atomic force microscope tip and cw-laser
We present topotactic changes on Mo4O11 crystals induced by a biased atomic force microscope tip and continuous laser. The transformation does not change the topography of the samples, while the surface potential shows remarkable changes on areas where the biased AFM tip was applied. No structural changes were observed by Raman spectroscopy, but AFM scans revealed changes to surface potential due to laser illumination. The observed phenomenon could be potentially useful for memristive memory devices considering the fact that properties of other molybdenum oxides vary from metallic to insulators. (C) 2015 Elsevier B.V. All rights reserved.