The electrochemical reduction of SiO2 in a molten LiF-NaF-KF electrolyte containing SiO2 at 873 K was studied using cyclic voltammetry and chronoamperometry. The cyclic voltammograms indicated that SiO2 is first dissolved in the electrolyte, followed by reduction on a Ag electrode. Si films were deposited by potentiostatic electrolysis on a Ag electrode, and the specimens obtained were characterized by Raman spectroscopy, X-ray diffraction, and scanning electron microscopy. Analysis of the Raman spectra indicated that the Si film obtained predominantly consists of the crystalline phase. (C) 2015 Published by Elsevier Ltd.