Results of etching (0 0 0 1) planes of flux grown strontium hexaferrite crystals in 85% H3PO4 at 120 degrees C and 37% HCl at 100 degrees C are presented. Fractography reveals one-to-one correspondence of cleavage patterns on the two matched (0 0 0 1) cleaved planes. Etch patterns including hexagonal, point-bottomed pits with smooth sloping planes, hexagonal but flat-bottomed pits, geometrically centred hexagonal pits with regularly spaced terracing, eccentric hexagonal pits with irregularly spaced terracing, a large flat-bottomed hexagonal pit with a smaller point-bottomed hexagonal pit within it but having different geometrical centres and flat-bottomed pits with a beak at their centres are illustrated. It is explained that they are indicative of normal, inclined, stepped and bending dislocations in strontium hexaferrite crystals. Pits due to impurity inclusions are also explained. The explanations are supported by the results of mismatchings of etch patterns on matched cleavages.