Single crystals of truns-stilbenc, C14H12, with properties suitable for high-energy neutron detection were grown from solution in anisole and toluene by the temperature reduction method with growth rates up to 6 mm/day. From these crystals, slices of appropriate orientation and thickness of 2-4 mm were cut and studied by X-ray diffraction topography applying the Lang method using CuK alpha radiation. The topographs exhibit growth defects such as liquid inclusions, dislocations, striations, and faulty growth-sector boundaries. These defects occur in the same typical arrangements and geometries as is observed in all kinds of crystals grown on habit faces from solution. Besides growth dislocations originating from inclusions and propagating with the growth front, many plastic glide dislocations in the shape of loops or half-loops emitted from inclusions by stress relaxation are observed. The glide system underlying this plasticity is discussed. (c) 2015 Elsevier B.V. All rights reserved.