The setting processes in the commercial glass ionomer cement (Fuji IX Fast) and resin modified glass ionomer cement (Fuji II LC) were investigated by the dielectric spectroscopy. The changes in the real and imaginary parts of the dielectric permittivity [epsilon*(omega)] as well as dielectric loss (tan delta) with time for Fuji IX Fast show several distinct regions which are related to the different stages of the acid-base reaction. Interestingly, the first stage that lasts for approximately 12 min terminates with a sharp decrease in dielectric parameters which is most probably related to the instantaneous (micro) fracturing of the sample due to a rapid build-up of the shrinkage stress. On the other hand, evolution of the dielectric properties during the setting of Fuji II LC indicates fast reaction in the initial stage (within few minutes) followed by the slow gradual change as a result of the competing nature of the acid-base reaction and light-activated polymerization.