The NixZn1-xFe2O4 thin films have been prepared using a simple spray pyrolysis technique. The X-ray diffraction studies reveal that, the films are polycrystalline with spinet structure. The lattice parameters vary in the range of 8.35-8.48 angstrom with composition (x) obeying Vegard's rule. SEM and AFM studies show that the surface of the films exhibit a smooth, compact and a pin hole free morphology. Raman spectra indicate first order Raman active modes; A(1g) (lambda = 334 cm(-1)); E-g (lambda = 148 cm(-1)) and T-2g (lambda = 699) of the NixZn1-xFe2O4. The investigation on dielectric constant, dielectric loss tangent and ac conductivity was carried out in the frequency range 20 Hz-1 MHz at room temperature. The linear nature of the AC conductivity shows small polaron type of hopping mechanism. The saturation magnetization increases up to x = 0.4 (143 emu/cm(3)), which decreases for higher x. (C) 2015 Elsevier Ltd. All rights reserved.