Molecular Crystals and Liquid Crystals, Vol.377, 381-384, 2002
In-plane structure analysis of BEDT-TTF thin films by X-ray diffraction
Dibis(ethyleneditho)tetrathiafulvalene (BEDT-TTF) was vacuum-deposited onto KCI (001) and KBr (001). The in-plane crystal orientations of epitaxial thin films were investigated by X-ray diffractometry. The epitaxial relationship between BEDT-TTF and substrates was determined as <211> (BEDT-TTF) // <110> (substrate).