Journal of Materials Science Letters, Vol.14, No.23, 1668-1671, 1995
Transmission Electron-Microscopy Characterization of a Fluorine-Doped Si3N4
Keywords:SILICON-NITRIDE CERAMICS;INTERGRANULAR FILM THICKNESS;RARE-EARTH-OXIDES;GRAIN-BOUNDARY;EQUILIBRIUM THICKNESS;PHASE;MICROSTRUCTURE;CRYSTALLIZATION;FABRICATION;ADDITIVES