A simple method is developed to determine the light trapping properties of arbitrarily textured solar cells with high accuracy. The method allows for determining the quantum efficiency and short circuit current density of thin film solar cells prepared on randomly nanotextured surfaces. The light trapping of the randomly textured solar cell is described by the area weighted superposition of periodically textured solar cells. The necessary input parameters for the calculations are determined by analyzing the randomly textured surfaces of the solar cells using atomic force microscopy and image processing. The analysis of the atomic force microscope images and the calculation of the quantum efficiency and short circuit current can be determined from current maps, without complex and time-consuming calculations. The calculated solar cell parameters exhibit excellent agreement with experimentally measured quantum efficiencies and short circuit current densities for amorphous and microcrystalline silicon thin film solar cells prepared on randomly textured substrates. Finally, the work contributes to a comparison of random and periodic light trapping structures. (c) 2015 Elsevier B.V. All rights reserved.