The near-edge X-ray absorption fine structure(NEXAFS) and its polarization dependence on Carbon(C) K-edge, is used to obtain information on the molecular orientation at the polyimide(PI) surface. Rubbed PI alignment layer was controlled the pile contact impression and stage speed. We could estimate the alignment angle of the molecules with the surface normal of the PI molecules through the intensity change of C=C * in NEXAFS C K-edge spectrum, depending on the photon incident angle =20 degrees, 55 degrees and 90 degrees. As increasing the depth of the pile contact, the angle was linearly decreased. The stage speed dependency was shown an irregular pattern.