Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.16, No.24, 2041-2042, 1997 DOI10.1023/A:1018508700439 Export Citation Yttrium segregation in the depth profile of ZrO2-Y2O3 films with argon or oxygen ion irradiation Huang NK, Zhang HL, Yang B, Wang DZ Keywords:ZIRCONIA Please enable JavaScript to view the comments powered by Disqus.
