Previous Article Next Article Table of Contents Advanced Materials, Vol.27, No.19, 3002-3006, 2015 DOI10.1002/adma.201500527 Export Citation Single Grain Boundary Break Junction for Suspended Nanogap Electrodes with Gapwidth Down to 1-2 nm by Focused Ion Beam Milling Cui AJ, Liu Z, Dong HL, Wang YJ, Zhen YG, Li WX, Li JJ, Gu CZ, Hu WP Keywords:focused ion beam milling;molecular electronics;nanogap electrodes Please enable JavaScript to view the comments powered by Disqus.
