Advanced Materials, Vol.27, No.25, 3811-3816, 2015
Pt/Ta2O5/HfO2-x/Ti Resistive Switching Memory Competing with Multilevel NAND Flash
Pt/Ta2O5/HfO2-x/Ti resistive switching memory with a new circuit design is presented as a feasible candidate to succeed multilevel-cell (MLC) NAND flash memory. This device has the following characteristics: 3 bit MLC, electroformingfree, self-rectifying, much higher cell resistance than interconnection wire resistance, low voltage operation, low power consumption, long-term reliability, and only an electronic switching mechanism, without an ionic-motion-related mechanism
Keywords:electroforming-free;multilevel switching;resistive switching memory;self-rectifying;uniformity