Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.19, No.2, 123-126, 2000 DOI10.1023/A:1006647430214 Export Citation A scanning photoemission microscope (SPEM) to study the interface chemistry of AlTi/C system Seal S, Warwick T, Sobczak N, Morgiel J Keywords:X-RAY MICROSCOPES;SPECTROMICROSCOPY;CARBON;METALS Please enable JavaScript to view the comments powered by Disqus.
