Previous Article Next Article Table of Contents Polymer Science and Technology, Vol.11, No.6, 798-805, December, 2000 Export Citation [고분자 특성분석 지상강좌] 고분자 표면분석을 위한 비행시간형 이차이온 질량분석(TOF-SIMS) 기술 Time-of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS) for Polymer Surface Analysis 이연희 Please enable JavaScript to view the comments powered by Disqus.
